Proceedings of IEEE Sensors 2003 (IEEE Cat. No.03CH37498)
DOI: 10.1109/icsens.2003.1279014
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Micrornechanical device for the measurement of the RMS value of high-frequency voltages

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Cited by 2 publications
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“…The first generation devices (Beissner et al, 2003) have electrodes on both glass plates as shown in Fig. 5.…”
Section: First Generationmentioning
confidence: 99%
See 1 more Smart Citation
“…The first generation devices (Beissner et al, 2003) have electrodes on both glass plates as shown in Fig. 5.…”
Section: First Generationmentioning
confidence: 99%
“…In this contribution we first discuss the theoretical basis for MEMS-based RF voltage measurement, with an emphasis on the design choices. We present an overview of first (Beissner et al, 2003), second (Dittmer et al, 2007a), and third…”
Section: Introductionmentioning
confidence: 99%