Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz

Jones, Rob D.; Cheron, Jerome; Bosworth, Bryan T.; Jamroz, Benjamin F.; Williams, Dylan F.; Urteaga, Miguel E.; Feldman, Ari D.; Aaen, Peter H.

doi:10.1109/bcicts54660.2023.10310853

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Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz

Cited by 4 publications

References 14 publications

Small-Signal Model Verification and Analysis of Unmatched Multi-Finger HBT Cells at 220 GHz

Small-Signal Model Verification and Analysis of Unmatched Multi-Finger HBT Cells at 220 GHz

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