Microstructural Passivation of Patterned Al₂O₃ Back Contacts on CdS/CdTe Solar Cells

Abstract

Patterned aluminum oxide (Al2O3) back contact on cadmium telluride (CdTe) solar cells can effectively mitigate the loss of the majority carriers while retaining the passivation benefits for minority carriers. This study investigates the impact of the point‐contact geometry on cell performance, where the spacing of the microholes is systematically varied at a constant microhole diameter (≈16 µm). Microhole arrays are created on an evaporated Al2O3 layer (≈30 nm) on CdTe using laser‐beam lithography and selective wet etching processes. Comparative analysis indicates a significant decrease in fill factor (FF) and short‐circuit current (ISC) when the contact fraction falls below 30%, likely due to the Al2O3 barrier impeding majority carriers. Above this fraction, FF and ISC are comparable to those of baseline CdTe cells without Al2O3. Open‐circuit voltage (VOC) shows a gradual decrease as Al2O3 coverage is reduced but exhibits a slight increase (<15 mV) when the contact fraction exceeds 30%. Cathodoluminescence (CL) characterization reveals that significantly improved radiative recombination occurs within the CdTe grain bulk with Al2O3, whereas this effect on grain boundaries is minimal. The findings imply complex local carrier dynamics in the patterned back‐contact region, closely tied to the microstructural properties of CdTe‐based solar cells.