Microstructure and Dielectric Properties of PZS-PLZT Ceramics System

Abstract

<p align="justify"> <span><span style="font-family:Verdana;">Piezoelectric ceramics are an important class of solid-state materials as they exhibit a wide range of applications. This article investigates the sintering temperature effect on microstructure</span><b> </b><span style="font-family:Verdana;">and dielectric properties of a new ceramics mate</span></span><span><span style="font-family:Verdana;">rial Pb (Zn, Sb) O</span>_{<span style="font-family:Verdana;">3</span>}<span style="font-family:Verdana;">-PbLa (Zr, Ti) O</span>_{<span style="font-family:Verdana;">3</span>}<span style="font-family:Verdana;"> (PZS-PLZT), which was prepared by a solid mixed-oxide solution method</span></span><span style="font-family:Verdana;">.</span><span style="font-family:Verdana;"> Scan</span><span style="font-family:Verdana;">ning electron micrograph (SEM) and X-ray diffraction (XRD) techniques was employed to examine the crystallization of the ceramics. The results of XRD show that the phase structure of the samples is tetragonal. The lattice parameters and the density increased with increase</span><span style="font-family:Verdana;"> of </span><span style="font-family:Verdana;">the sintering temperature. The dielectric constant and the dielectric loss of the investigated samples decreased with increase in the frequency.</span><span></span> </p> <p align="justify"> <span></span> </p> <p> <span></span> </p