Microstructure change and helium release due to tensile loading on austenitic stainless steel implanted with low energy helium ions

Kawakami, Tsukasa; Tokunaga, Kazutoshi; Yoshida, N.

doi:10.1016/j.jnucmat.2007.03.116

Cited by 2 publications

(1 citation statement)

References 7 publications

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“…At this point it is not clear whether these structures are related to some degradation of the polymer materials or whether they are due to bubble formation induced by the implantation of rare gas atoms. The latter has been observed among other for gallium nitride [ 28 ], silicon [ 29 ], iron [ 30 ] or steel [ 31 ], and tungsten [ 32 ] under helium irradiation.…”

Section: Resultsmentioning

confidence: 84%

Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

Rzeznik

Fleming

Wirtz

et al. 2016

Beilstein J. Nanotechnol.

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SummarySecondary ion mass spectrometry (SIMS) on the helium ion microscope (HIM) promises higher lateral resolution than on classical SIMS instruments. However, full advantage of this new technique can only be obtained when the interaction of He+ or Ne+ primary ions with the sample is fully controlled. In this work we investigate how He+ and Ne+ bombardment influences roughness formation and preferential sputtering for polymer samples and how they compare to Ar+ primary ions used in classical SIMS by combining experimental techniques with Molecular Dynamics (MD) simulations and SD_TRIM_SP modelling. The results show that diffusion coefficients for He, Ne and Ar in polymers are sufficiently high to prevent any accumulation of rare gas atoms in the polymers which could lead to some swelling and bubble formation. Roughness formation was also not observed. Preferential sputtering is more of a problem, with enrichment of carbon up to surface concentrations above 80%. In general, the preferential sputtering is largely depending on the primary ion species and the impact energies. For He+ bombardment, it is more of an issue for low keV impact energies and for the heavier primary ion species the preferential sputtering is sample dependent. For He+ steady state conditions are reached for fluences much higher than 1018 ions/cm2. For Ne+ and Ar+, the transient regime extends up to fluences of 1017–1018 ions/cm2. Hence, preferential sputtering needs to be taken into account when interpreting images recorded under He+ or Ne+ bombardment on the HIM.

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Section: Resultsmentioning

confidence: 84%

Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

Rzeznik

Fleming

Wirtz

et al. 2016

Beilstein J. Nanotechnol.

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Diffusion Behavior of Cumulative He Doped in Cu/W Multilayer Nanofilms at Room Temperature

Liu

Shi

et al. 2016

Chinese Phys. Lett.

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Cu/W multilayer nanofilms are prepared in pure Ar and He/Ar mixing atmosphere by the rf magnetron sputtering method. The cross-sectional morphology and the defect distribution of the Cu/W multilayer nanofilms are characterized by scanning electron microscopy and Doppler broadening positron annihilation spectroscopy. The results show that plenty of point defects can be produced by introducing He during the growth of the multilayer nanofilms. With the increasing natural storage time, He located in the near surface of the Cu/W multilayer nanofilm at room temperature could be released gradually and induce the segregation of He-related defects due to the diffusion of He and defects. However, more He in the deep region spread along the interface of the Cu/W multilayer nanofilm. Meanwhile, the layer interfaces can still maintain their stability.

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Microstructure change and helium release due to tensile loading on austenitic stainless steel implanted with low energy helium ions

Cited by 2 publications

References 7 publications

Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

Diffusion Behavior of Cumulative He Doped in Cu/W Multilayer Nanofilms at Room Temperature

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