Microstructure, charge carrier conduction mechanism model, dielectric properties and leakage current analysis of Dy2FeMnO6 nanomaterial

Anirban, Sk.; Roy, Rajdip; Dutta, Abhigyan

doi:10.1016/j.ceramint.2022.12.091

Cited by 5 publications

(1 citation statement)

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“…The Shottky-Richardson mechanism essentially involves field-amplified or field-assisted thermionic emission, where the work function associated with thermionic emission is reduced through the application of an external electric field. Consequently, this mechanism adheres to a field-adjusted Richardson-Dushman equation, as follows: 54,55 7suggests that plot of log J/T 2 vs E 1/2 should display a linear pattern for the Shottky-Richardson (S-R) mechanism to be present within the system. As observable from Fig.…”

Section: Modulus Studymentioning

confidence: 67%

Influence of Ho, Gd, La Doping on Grain-Grain Boundary Characteristics and Minimization of Leakage Current in Nickel Ferrites

Kumar,

Mondal,

Dutta

et al. 2024

ECS J. Solid State Sci. Technol.

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This study explores the impact of doping with Ho, Gd, and La on sol-gel-derived nickel ferrites through a comprehensive analysis using various analytical techniques. The combination of X-ray diffraction (XRD) analysis, X-ray fluorescence (XRF) spectra analysis, impedance spectroscopy, and I-V analysis enables a detailed exploration of the structural, compositional, and electrical characteristics of the samples. Williamson-Hall plots in XRD analysis reveal crucial insights into grain and grain boundary impacts, revealing a shift in trends for doped samples indicative of tensile strain and underscores the influence of dopant ions on lattice distortion. XRF study confirms the elemental composition of the samples, validating the experimental approach. Impedance spectroscopy sheds light on conduction mechanisms and charge transfer processes, while the modulus study identifies distinct relaxation peaks corresponding to grain and grain boundary relaxation mechanisms. IV analysis demonstrates a significant reduction in leakage current with rare Earth element doping, suggesting promising applications.

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Section: Modulus Studymentioning

confidence: 67%