Mobility Degradation Induced by Substrate-Hot-Electron Generated Interface Traps at Different Stress Voltages and Temperatures

Hsu, Chun-Hsiang; Lin, Chau-Jy

doi:10.7567/ssdm.1993.pb-3-11

Extended Abstracts of the 1993 International Conference on Solid State Devices and Materials 1993

DOI: 10.7567/ssdm.1993.pb-3-11

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Mobility Degradation Induced by Substrate-Hot-Electron Generated Interface Traps at Different Stress Voltages and Temperatures

Chun-Hsiang Hsu¹,

Chau-Jy Lin²

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Mobility Degradation Induced by Substrate-Hot-Electron Generated Interface Traps at Different Stress Voltages and Temperatures

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