Modeling and simulation of oscillator-based random number generators

Petrie, C.S.; Connelly, J.A.

doi:10.1109/iscas.1996.541967

Cited by 47 publications

(27 citation statements)

References 5 publications

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“…The proposed TRNG passed NIST test with a small area without using post processing. In addition, this work has a significant advantage that the TRNG is tolerant to process variation and temperature fluctuation in addition to the robustness to deterministic noises [6], whereas these tolerance and robustness are not clearly stated in the previous publications.…”

Section: E Comparisonmentioning

confidence: 88%

A process and temperature tolerant oscillator-based true random number generator with dynamic 0/1 bias correction

Amaki

Hashimoto

Onoye

2013

2013 IEEE Asian Solid-State Circuits Conference (A-Sscc)

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Abstract-This paper presents an oscillator-based true random number generator (TRNG) that dynamically unbiases 0/1 probability. The proposed TRNG automatically adjusts the duty cycle of a fast oscillator to 50 %, and generates unbiased random numbers tolerating process variation and dynamic temperature fluctuation. A prototype chip of the proposed TRNG was fabricated with a 65 nm CMOS process. Measurement results show that the developed duty cycle monitor obtained the probability of '1' 4,100 times faster than the conventional output bit observation, or estimated the probability with 70 times higher accuracy. The proposed TRNG adjusted the probability of '1' to within 50 ± 0.07 % in five chips in the temperature range of 0• C to 75• C. Consequently, the proposed TRNG passed the NIST and DIEHARD tests at 7.5 Mbps with 6,670 μm 2 area.

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Section: E Comparisonmentioning

confidence: 88%

A process and temperature tolerant oscillator-based true random number generator with dynamic 0/1 bias correction

Amaki

Hashimoto

Onoye

2013

2013 IEEE Asian Solid-State Circuits Conference (A-Sscc)

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“…1 have been widely studied [20]- [29], [39], [40]. Due to relatively large amount of jitter, present in generated signal, ROs are increasingly used as a source of randomness in hardware true random number generators [20]- [29], [39]. Frequency of signal generated by a single ring oscillator is equal to…”

Section: A Jitter Produced By Ring Oscillators As a Source Of Randommentioning

confidence: 99%

“…The generators, called the source generators, can use different sources of randomness. It can be noise generated by a physical system [1]- [5], metastable states [6]- [10], the chaos phenomenon [11]- [19] or jitter produced by ring oscillators [20]- [29]. Mixed solutions that combine various properties of these basic techniques also exist.…”

Section: Introductionmentioning

confidence: 99%

Producing Random Bits with Delay-Line-Based Ring Oscillators

Jessa¹,

Matuszewski²

2013

International Journal of Electronics and Telecommunications

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Abstract-One of the sources of randomness for a random bit generator (RBG) is jitter present in rectangular signals produced by ring oscillators (ROs). This paper presents a novel approach for the design of delays used in these oscillators. We suggest using delay elements made on carry4 primitives instead of series of inverters or latches considered in the literature. It enables the construction of many high frequency ring oscillators with different nominal frequencies in the same field programmable gate array (FPGA). To assess the unpredictability of bits produced by RO-based RBG, the restarts mechanism, proposed in earlier papers, was used. The output sequences pass all NIST 800-22 statistical tests for smaller number of ring oscillators than the constructions described in the literature. Due to the number of ROs with different nominal frequencies and the method of construction of carry4 primitives, it is expected that the proposed RBG is more robust to cryptographic attacks than RBGs using inverters or latches as delay element.

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“…A first example of stateless noise source can be obtained from the well-know oscillator-based random bit generator [8,9,10,11] if both oscillators are stopped after each bit generation (Figure 3), thus avoiding the phase shifting between f fast and f slow . If digital ring oscillators are employed to implement f fast and f slow , the start-up time is usually a small fraction of the their oscillating period.…”

Section: Examples Of Stateless Sourcesmentioning

confidence: 99%

Design of Testable Random Bit Generators

Bucci

Luzzi

2005

Lecture Notes in Computer Science

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Abstract. In this paper, the evaluation of random bit generators for security applications is discussed and the concept of stateless generator is introduced. It is shown how, for the proposed class of generators, the verification of a minimum entropy limit can be performed directly on the post-processed random numbers thus not requiring a good statistic quality for the noise source itself, provided that a sufficient compression is adopted in the post-processing unit. Assuming that the noise source is stateless, a straightforward entropy estimator to drive an adaptive compression algorithm is proposed. Examples of stateless sources are also discussed.Finally, an attack scenario against a noise source is defined and an effective approach to the attack detection is presented. The entropy estimator and the attack detection together guarantee the unpredictability of the generated random numbers.

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Modeling and simulation of oscillator-based random number generators

Cited by 47 publications

References 5 publications

A process and temperature tolerant oscillator-based true random number generator with dynamic 0/1 bias correction

A process and temperature tolerant oscillator-based true random number generator with dynamic 0/1 bias correction

Producing Random Bits with Delay-Line-Based Ring Oscillators

Design of Testable Random Bit Generators

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