Abstract:The optical resonances that occur in nanostructured metal layers are modulated in thin film stacks if the nanostructured layer is separated from a reflecting conducting layer by various thicknesses of thin dielectric. We have measured and modeled the optical response of interacting silver layers, with alumina spacer thickness ranging from a few nm to 50 nm, for s-and p-polarized incident light, and a range of incident angles. Standard thin film models, including standard effective medium models for the nanostr… Show more
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