Modulation Distortion Analysis for Mixers and Frequency Converters

Verspecht, Jan; Nielsen, Troels S.; Stav, Augustine; Dunsmore, Joel; Teyssier, Jean-Pierre

doi:10.1109/arftg47271.2020.9241379

Cited by 8 publications

(3 citation statements)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Similarly, for the fractional-N PLL, the mixer's output PSD due to PLL phase noise, S Y 1 (f ), is derived by replacing every η in (13) with S I (f ) in ( 26), and subsequently, convolving the result with (5). However, the resulting integration does not lead to a closed-form expression, and can only be calculated numerically.…”

Section: B Fractional-n Pll Impact On Oobementioning

confidence: 99%

“…Therefore, the baseband bandwidth is limited to a certain value specified by a specific standard. This bandwidth-limited signal, upon multiplication with an LO signal, creates out-of-band frequency components because of two main reasons: (1) the RF mixing often involves multiplication of the baseband signal with the fundamental component as well as higher harmonics of the LO signal, thereby producing unwanted frequency components at the output of the mixer [13]. (2) The LO signal itself is never a pure sinusoid.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

A Study of Out-of-Band Emission in Digital Transmitters Due to PLL Phase Noise, Circuit Non-Linearity, and Bandwidth Limitation

Oveisi,

Hosseinisangchi,

Heydari

2023

IEEE Open J. Circuits Syst.

View full text Add to dashboard Cite

A thorough investigation of major contributors to out-of-band emission (OOBE) in transmitters (TXs) utilizing digital modulation schemes is provided. Specifically, the paper delves into the detrimental effects of phase noise of the local oscillator (LO), typically realized using a phase-locked loop (PLL), on the OOBE phenomenon. Furthermore, the effects of the circuit nonlinearity in a TX, widely recognized as a primary contributor to spectral regrowth and elevated levels of OOBE, are investigated. Additionally, the impact of filtering and bandwidth (BW) limitation on OOBE is taken into account. Comprehensive simulations verify the accuracy of the analytical study. The results provided throughout this paper can be used to determine the linearity and phase noise requirements of different blocks, such as PLL and power amplifier (PA) within a TX chain to design a system complying with a specific mask emission dictated by a particular standard.INDEX TERMS Bandwidth (BW), local oscillator (LO), out-of-band emission (OOBE), phase noise, phaselocked loop (PLL), power amplifier (PA), transmitter (TX).

show abstract

Section: B Fractional-n Pll Impact On Oobementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

A Study of Out-of-Band Emission in Digital Transmitters Due to PLL Phase Noise, Circuit Non-Linearity, and Bandwidth Limitation

Oveisi,

Hosseinisangchi,

Heydari

2023

IEEE Open J. Circuits Syst.

View full text Add to dashboard Cite

show abstract

“…In [15], a switched configuration based on a fourport Large-Signal Network Analyzer (LSNA) makes use of a sequential two-port calibration for CW characterization of an outphasing PA. Solutions have been proposed for measuring the EVM of two-port [17], [18] or frequency converting devices [20], [22] on the basis of spectral correlations from relative acquisitions and absolute power measurements in the frequency domain.…”

mentioning

confidence: 99%

A VNA-Based Wideband Measurement System for Large-Signal Characterization of Multiport Circuits

Schulze,

Mengozzi,

Gibiino

et al. 2024

IEEE Trans. Microwave Theory Techn.

View full text Add to dashboard Cite

This work reports on a wideband (WB) measurement system based on a vector network analyzer (VNA) topology for multi-port large-signal measurements. The setup exploits a modified commercial VNA with WB intermediate frequency (IF) outputs that allows for more than 5 GHz analysis bandwidth (BW), where the IF is captured using an external high-speed oscilloscope. A three-port configuration using six receivers is described, together with the signal processing to achieve the high dynamic range required for WB signal measurements. The calibration procedure to establish reference planes at the three ports of the device-under-test (DUT) are shown. A comparison is made between single-tone continuous-wave (CW) calibration and WB calibration using multi-tone signals, illustrating advantages, challenges and limitations. The system is then demonstrated for on-wafer WB characterization and linearization of a Dual Input Doherty Power Amplifier (DIDPA) using a 100-MHz instantaneous BW excitation signal at millimeter-wave frequencies. By leveraging on the error-corrected WB waves, an algorithm is proposed for modulated input signal control across a 600-MHz acquisition BW at the DUT on-wafer reference planes. The algorithm enables a user-defined emulated splitting of the input WB signals. The linearization performance of such an emulated PA configuration is finally evaluated.Index Terms-Digital predistortion (DPD), doherty power amplifier (DPA), millimeter-wave measurements, vector network analyzer (VNA), wideband measurements. I. INTRODUCTIONM ODERN applications of wireless telecommunications, as well as radar, exploit modulated signals at millimeter-wave frequencies with increasingly wider bandwidths (BWs), in the range of hundreds of MHz and beyond. Components and subsystems are therefore required to operate across large instantaneous BWs, so that instrumentation and characterization features need to be adapted to this demanding scenario. Nonlinear devices, such as radio-frequency (RF) power amplifiers (PAs), require network analysis to extract figures-of-merit (FoMs) like input and output match, available power gain, load-pull contours, etc. At the same time, they also require signal analysis FoMs like the error vector magnitude (EVM) [1]. As an additional complication, modern PA topologies addressing the ever-demanding trade-off between broadband linearity and power efficiency often result This work was partly funded by the German Federal Ministry of Education and Research (BMBF) under the project reference 16FMD02 (Forschungsfabrik Mikroelektronik Deutschland). C. Schulze, W. Heinrich and O. Bengtsson are with Ferdinand-Braun-Institut, Leibniz-Institut fuer Hoechstfrequenztechnik, Gustav-Kirchhoff-Str.

show abstract

VNA-Based Characterization of Frequency Multipliers Phase-Distortions Under Continuous-Wave and Modulated Signal Excitation

Eladwy,

Ayed,

Boumaiza

2023

2023 101st ARFTG Microwave Measurement Conference (ARFTG)

View full text Add to dashboard Cite

Modulation Distortion Analysis for Mixers and Frequency Converters

Cited by 8 publications

References 2 publications

A Study of Out-of-Band Emission in Digital Transmitters Due to PLL Phase Noise, Circuit Non-Linearity, and Bandwidth Limitation

A Study of Out-of-Band Emission in Digital Transmitters Due to PLL Phase Noise, Circuit Non-Linearity, and Bandwidth Limitation

A VNA-Based Wideband Measurement System for Large-Signal Characterization of Multiport Circuits

VNA-Based Characterization of Frequency Multipliers Phase-Distortions Under Continuous-Wave and Modulated Signal Excitation

Contact Info

Product

Resources

About