Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002
DOI: 10.1109/delta.2002.994594
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Multi-level fault simulation of digital systems on decision diagrams

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Cited by 6 publications
(2 citation statements)
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“…During the last decade, the HLDDs have been used in different fields of highlevel and hierarchical test. As the result, new promising algorithms, techniques and prototype tools have been developed, which allowed to improve the efficiency of RT level cycle based simulation [63,64], hierarchical test program automated synthesis [65,66], hierarchical fault simulation [67,68], and fault diagnosis [69].…”
Section: Overview Of High Level Dds 31 Short History Of Hldd Developmentioning
confidence: 99%
“…During the last decade, the HLDDs have been used in different fields of highlevel and hierarchical test. As the result, new promising algorithms, techniques and prototype tools have been developed, which allowed to improve the efficiency of RT level cycle based simulation [63,64], hierarchical test program automated synthesis [65,66], hierarchical fault simulation [67,68], and fault diagnosis [69].…”
Section: Overview Of High Level Dds 31 Short History Of Hldd Developmentioning
confidence: 99%
“…The authors of this paper proposed a concept of hierarchical fault simulation [6] using a deductive algorithm on High-Level Decision Diagram (HLDD) models [7]. The method assumed that gate-level descriptions of all the modules exist and modeled faults in the circuits hierarchically at the register-transfer and logic levels.…”
Section: Introductionmentioning
confidence: 99%