2024 IEEE Design Methodologies Conference (DMC) 2024
DOI: 10.1109/dmc62632.2024.10812155
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Multidimensional Characterization of Temperature Sensitive Electrical Parameters in SiC Mosfets using Automation of Measurement Data Analysis

Oleksandr Solomakha,
Kevin Muñoz Barón,
Valentyna Afanasenko
et al.
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