Multilayer based soft-x-ray polarimeter at MAX IV Laboratory

Grizolli, Walan; Laksman, Joakim; Hennies, Franz; Jensen, Bente; Nyholm, R.; Sankari, R.

doi:10.1063/1.4941066

Cited by 10 publications

(5 citation statements)

References 30 publications

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“…The degree of linear polarization is >0.98 in the horizontal plane, which is consistent with earlier measurements at this beamline; see Ref. 13. We have then measured the degree of polarization for a few discrete incidence angles of the beam on the polarizer film with the magnetic field aligned parallel to the film's surface (Fig.…”

supporting

confidence: 75%

Note: Soft X-ray transmission polarizer based on ferromagnetic thin films

Müller

Hartmann

Schleitzer

et al. 2018

Review of Scientific Instruments

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A transmission polarizer for producing elliptically polarized soft X-ray radiation from linearly polarized light is presented. The setup is intended for use at synchrotron and free-electron laser beamlines that do not directly offer circularly polarized light for, e.g., X-ray magnetic circular dichroism (XMCD) measurements or holographic imaging. Here, we investigate the degree of ellipticity upon transmission of linearly polarized radiation through a cobalt thin film. The experiment was performed at a photon energy resonant to the Co L3-edge, i.e., 778 eV, and the polarization of the transmitted radiation was determined using a polarization analyzer that measures the directional dependence of photo electrons emitted from a gas target. Elliptically polarized radiation can be created at any absorption edge showing the XMCD effect by using the respective magnetic element.

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supporting

confidence: 75%

Note: Soft X-ray transmission polarizer based on ferromagnetic thin films

Müller

Hartmann

Schleitzer

et al. 2018

Review of Scientific Instruments

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“…from À 90 to + 90 . The degree of polarization in the helical mode as well as the linear polarization direction in the inclined mode have been characterized by a multilayer-based soft X-ray polarimeter (Grizolli et al, 2016). For example, Fig.…”

Section: Insertion Devicementioning

confidence: 99%

MAXPEEM: a spectromicroscopy beamline at MAX IV laboratory

Niu¹,

Vinogradov²,

Preobrajenski³

et al. 2023

J Synchrotron Rad

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MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single-digit nanometre spatial resolution. The beamline can deliver a high photon flux of ≥1015 photons s−1 (0.1% bandwidth)−1 in the range 30–1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X-rays from the synchrotron pass through the first beam separator and impinge the surface at normal incidence. The microscope is equipped with an energy analyzer and an aberration corrector which improves both the resolution and the transmission compared with standard microscopes. A new fiber-coupled CMOS camera features an improved modulation transfer function, dynamic range and signal-to-noise ratio compared with the traditional MCP-CCD detection system.

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“…Note that this technique is only capable of determining the linear polarin contrast to invasive multilayer based polarimetry where the complete Stokes vector is found. 43…”

Section: Article Scitationorg/journal/rsimentioning

confidence: 99%

Development of a photoelectron spectrometer for hard x-ray photon diagnostics

Laksman

Dietrich

Liu

et al. 2022

Review of Scientific Instruments

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The development and characterization of an angle-resolved photoelectron spectrometer, based on the electron time-of-flight concept, for hard x-ray photon diagnostics at the European Free-Electron Laser, are described. The instrument is meant to provide users and operators with pulse-resolved, non-invasive spectral distribution diagnostics, which in the hard x-ray regime is a challenge due to the poor cross-section and high kinetic energy of photoelectrons for the available target gases. We report on the performances of this instrument as obtained using hard x-rays at the PETRA III synchrotron at DESY in multibunch mode. Results are compared with electron trajectory simulations. We demonstrate a resolving power of 10 eV at incident photon energies up to at least 20 keV.

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Multilayer based soft-x-ray polarimeter at MAX IV Laboratory

Cited by 10 publications

References 30 publications

Note: Soft X-ray transmission polarizer based on ferromagnetic thin films

Note: Soft X-ray transmission polarizer based on ferromagnetic thin films

MAXPEEM: a spectromicroscopy beamline at MAX IV laboratory

Development of a photoelectron spectrometer for hard x-ray photon diagnostics

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