Multilevel morphological analysis of continuous films and surfaces

Hrach, R.; Novotný, Dušan; Novák, Stanislav; Pavlík, Jaroslav

doi:10.1016/s0040-6090(03)00316-x

Cited by 4 publications

(2 citation statements)

References 3 publications

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“…There exist powerful methods, including methods of mathematical morphology, applied mainly to binary images [1,2]. However, so far, they have been used mainly in the context of discontinuous thin film morphology and for description of simpler or idealized structures [3,4,5].…”

Section: Introductionmentioning

confidence: 99%

Thin film description by wavelet coefficients statistics

Boldyš

Hrach

2005

Czech J Phys

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Descriptive and robust features based on wavelet transform coefficients are proposed for a multiscale thin film image analysis. The features are based on one-and two-dimensional histograms of the wavelet transform coefficients and they can be calculated for every scale of the wavelet decomposition. A one-dimensional histogram model is extended to describe also two-dimensional histograms, by means of calculating marginal histograms and by sampling the two-dimensional histograms in orientation. A computer experiment has been performed to demonstrate correspondence of the derived features to various physical phenomena.

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Section: Introductionmentioning

confidence: 99%

Thin film description by wavelet coefficients statistics

Boldyš

Hrach

2005

Czech J Phys

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“…works devoted to mathematical morphology and other statistics [1,2,3,4]. However, applicability of these results to semicontinuous thin film description is limited and other image processing tools have to be used.…”

Section: Introductionmentioning

confidence: 99%

Multiscale semicontinuous thin film descriptors

Boldyš

Hrach

2004

Open Physics

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In experimental thin film physics, there is a demand to characterize a growing thin film or the thin film resulting from an experiment. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods is collected and further developed, which results in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles are analyzed in a multiscale manner. The descriptiveness of the proposed features is demonstrated on a few thin film photographs from real experiments. This work establishes a basis for further measurement, description, simulation or other processing in the physics of semicontinuous thin films, using any direct imaging modality.

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