Multimodal Artifact Metrics for Conductive Synthetic Resin Products

Abstract

In this paper, we propose multimodal artifact metrics, which are based on multimodal identification metrics in biometrics. These metrics should verify an artifact's authenticity with high accuracy using more than two characteristic types of information with different physical characteristics that are extracted from the artifact. In this technique, the counterfeiting of copied products is more difficult, even for the manufacturers who are producing the genuine products. In order to explore the feasibility of this idea, we present the results of two experiments: One is the creation of samples made of conductive polymer and filler with optical characteristics. The other one extracts two types of characteristic information from each sample. The extracted information (resistance and IR image) was different for each specimen, as we anticipated.Index Terms-Artifact metrics, characteristic information, multimodal, verification of authenticity.