DOI: 10.4995/thesis/10251/38761
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Multipactor in Multicarrier Systems. Theory and Prediction

Abstract: A mis padres, a mis hijos, Darío y Marco. AgradecimientosLos inicios de esta tesis doctoral se remontan allá por el 2006 cuando Vicente Boria me ofreció la oportunidad de hacer el doctorado dentro una empresa tecnológica valenciana que acababa de nacer: Aurorasat. Por circunstancias de la vida, en ese momento yo estaba embarcado en otro proyecto profesional. Pero Vicente, como siempre, fue muy persuasivo y finalmente me convenció para unirme a ellos. De todas las decisiones que he tomado, en todos losámbitos d… Show more

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Cited by 3 publications
(3 citation statements)
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References 35 publications
(106 reference statements)
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“…This domain reduction provides results close to the worstcase assuming that the breakdown voltage varies smoothly with the signal phases. This also assumes that, since different phase combinations may yield similar envelopes, there are multiple regions with values close to the lowest breakdown value [30]. See for example the breakdown voltage map of a four carrier multipactor signal in Fig.…”
Section: B the Envelope Sweep Methodologymentioning
confidence: 99%
See 1 more Smart Citation
“…This domain reduction provides results close to the worstcase assuming that the breakdown voltage varies smoothly with the signal phases. This also assumes that, since different phase combinations may yield similar envelopes, there are multiple regions with values close to the lowest breakdown value [30]. See for example the breakdown voltage map of a four carrier multipactor signal in Fig.…”
Section: B the Envelope Sweep Methodologymentioning
confidence: 99%
“…The 20GCR with phase optimization (20G) and with boundary curve (20GB), have been implemented as established in the ECSS standard 2003 version and using the Multipactor Tool [33] software utility. Global phase optimization has been done with NS multipactor theory (GNS) [15], using the optimization procedure of [30].…”
Section: Analytical Verificationmentioning
confidence: 99%
“…This effect is challenging to characterise as it exhibits a random nature that depends on several factors, such as the material of the surface, its roughness, and the presence of impurities. This means that Secondary Emission Yield (SEY) curves for standard materials cannot be generally applied to specific devices, and it is highly recommended to measure the SEY of the specific materials of the devices under test [132].…”
Section: Secondary Emission Yield Measurementmentioning
confidence: 99%