Multiple high-voltage pulse stressing of conventional thick-film resistors

Thick‐Film Resistor Failure Analysis Based on Low‐Frequency Noise Measurements

“…Moreover, several papers explored properties of thick-film surge resistors [11] that serve as protection of communication systems from a variety of voltage disturbances such as short duration, high-voltage transients caused by lightning strikes or longer duration over voltages. Nowadays, the revival of thick-film technology that can be attributed to new applications of thick-film resistors induced the necessity of extensive behavioural studies related to undesirable high-voltage pulse stressing of conventional thick resistive films [12][13][14].…”

“…During testing, several encapsulated resistors suffered progressive resistor degradation that led to catastrophic failure [13]. The photograph of the characteristic mode of progressive 10 kΩ/sq resistor degradation due to thermal effects induced by high-voltage treatment is given in Figure 11.…”

“…Photographs of progressive resistor degradation due to high-voltage pulse stressing: melting of glass encapsulant, direct exposure of resistive layer to surrounding atmosphere and burned and partially evaporated resistive layer [13]. It should be mentioned that the failure of resistive layers due to high-voltage pulse stressing is often accompanied by the failure of conducting paths.…”

Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors

“…Also, several papers explored properties of low-ohm thick-film surge resistors [9] that serve as protection of communication systems. However, little attention has been paid to the influence of high-voltage pulse stressing on structure and noise performances of conventional thick-film resistors [20,21].…”

“…Experimental data obtained by extensive investigations of performances of thick-film resistors subjected to this type of straining [20,21] showed that behaviour under strain strongly depends Table 1. Experimental data (nominal sheet resistance R sq , resistor length l, mean value of initial resistance R i , relative resistance change due to mechanical straining ΔR/R i , gauge factor GF, noise index NI and resistor length change Δl) for thick-film resistors with different geometries (width: w = 1 mm, length: l = 2, 4 and 6 mm) subjected to maximal mechanical straining of 400 μm [16].…”