2009
DOI: 10.1103/physrevb.79.104509
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Multiple-retrapping processes in the phase-diffusion regime of high-Tcintrinsic Josephson junctions

Abstract: We report measurements of switching current distribution ͑SWCD͒ from a phase-diffusion branch ͑PDB͒ to a quasiparticle-tunneling branch ͑QTB͒ as a function of temperature in a cuprate-based intrinsic Josephson junction. Contrary to the thermal-activation model, the width of the SWCD increases and the corresponding switching rate shows a nonlinear behavior with a negative curvature in a semilogarithmic scale with decreasing temperature down to 1.5 K. Based on the multiple-retrapping model, we quantitatively dem… Show more

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Cited by 23 publications
(17 citation statements)
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“…On the other hand this model, which assumes separated levels in the metastable well, is not properly valid for a single Josephson junction since the number of energy levels is large and the separation is smaller than their width. Männik et al 3 and Bae et al 6 calculated the retrapping probability through Monte Carlo simulations and included frequency dependent damping. The authors expressed the net escape rate as a sum of probabilities of multiple escape-retrapping events based on thermal escape rate and retrapping probability.…”
Section: Discussion and Concluding Remarksmentioning
confidence: 99%
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“…On the other hand this model, which assumes separated levels in the metastable well, is not properly valid for a single Josephson junction since the number of energy levels is large and the separation is smaller than their width. Männik et al 3 and Bae et al 6 calculated the retrapping probability through Monte Carlo simulations and included frequency dependent damping. The authors expressed the net escape rate as a sum of probabilities of multiple escape-retrapping events based on thermal escape rate and retrapping probability.…”
Section: Discussion and Concluding Remarksmentioning
confidence: 99%
“…The quality of the fitting procedure is even more significant if we consider that we do not have any degree of freedom associated to a possible frequency dependence of Q as occurring in other experiments 1, 3,6 . For instance the procedure used for our analysis is different from that used by Männik et al 3 , where retrapping probability is calculated independently for different dissipations.…”
Section: Data and Analysismentioning
confidence: 99%
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“…RT Þ lnð1 À P RT Þ. P RT is obtained from integration of the retrapping rate 54,55 G RT ¼ o p ½ð1 À I r0 Þ=I c0 ðE J0 =2pk B TÞ 1=2 expð À DU RT =k B TÞ, with the retrapping potential barrier DU RT (I) ¼ (E J0 Q 0 2 /2)[(I-I r0 )/I c0 ] 2 , where I r0 is the fluctuation-free retrapping current and Q 0 ¼ 4I c0 /pI r0 . P(I c ) in the TA regime has a left-tailed asymmetric shape.…”
Section: Methodsmentioning
confidence: 99%
“…This effect has been observed in the voltage-current (V -I) characteristics, which are greatly altered by the amount of dissipation. The statistics of the switching and retrapping behavior in shunted JJs have been investigated in last three decades and continues to be actively studied [32][33][34][35][36][37][38][39] . In general, the retrapping current, which is inversely proportional to the quality factor Q of the circuit, is more sensitive to the amount of damping/dissipation than the switching current.…”
Section: Introductionmentioning
confidence: 99%