Abstract:Multivariate statistical analysis (MSA) methods comprise a number of powerful techniques for reducing high-dimension data to a more manageable and interpretable lower dimension solution [1][2]. Moving beyond spectroscopic data large image and diffraction series can now be acquired [2,3]. Previously the analysis with MSA of a 183 Gb diffraction series was described [2] and in this work we will describe a deeper look in to the same data set combined with simultaneously acquired X-ray spectral data at each real-s… Show more
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