2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2021
DOI: 10.1109/ipfa53173.2021.9617368
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NAND Flash Relationship Between the Initial State of Non-Volatile Memory Cycling Endurance and the High Temperature Data Retention Ability of Post Cycling

Huang Chia-Sheng
1
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Yun-Chi Liao
2
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