2016
DOI: 10.1016/j.chemosphere.2015.11.059
|View full text |Cite
|
Sign up to set email alerts
|

Nano-mineralogy of suspended sediment during the beginning of coal rejects spill

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

1
8
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
10

Relationship

0
10

Authors

Journals

citations
Cited by 85 publications
(9 citation statements)
references
References 25 publications
1
8
0
Order By: Relevance
“…For other hazardous trace elements, the solid samples were first digested by a HF-HNO 3 solution in a microwave oven. The recovered solution samples and the liquid samples were analyzed for As, Cd, Se, Cr, and Pb using inductively coupled plasma mass spectrometry with reported by other authors. X-ray fluorescence was used to determine the contents of major oxides and minor elements in the solid samples. The particle size of the solid samples was determined by a Malvern Particle Size Analyzer (MASTERSIZER 2000).…”
Section: Methodsmentioning
confidence: 99%
“…For other hazardous trace elements, the solid samples were first digested by a HF-HNO 3 solution in a microwave oven. The recovered solution samples and the liquid samples were analyzed for As, Cd, Se, Cr, and Pb using inductively coupled plasma mass spectrometry with reported by other authors. X-ray fluorescence was used to determine the contents of major oxides and minor elements in the solid samples. The particle size of the solid samples was determined by a Malvern Particle Size Analyzer (MASTERSIZER 2000).…”
Section: Methodsmentioning
confidence: 99%
“…Sequential extraction and magnetic separation were applied [25]. In order to obtain composition information, a dual ion beam (FIB) of the FEI-DualBeamTM Helios 600 NanolabTM, high resolution emission (FEG) for SEM [26][27][28][29], trimmed by lens detectors (TLD), Everhart-Thornley (ETD) and electron backscattered (BSED) were used in this study [30][31][32]. Finally, a high resolution focused Ga+ ion beam to select [33][34][35][36], cut, and obtain an accurate image of a specific region of the species of interest, within the range of 100 nm, was also used [37][38][39][40][41].…”
Section: Methodsmentioning
confidence: 99%
“…It was also added for the analysis of NPs by HR-TEM. It should be noted that it was not necessary to prepare the collected samples to perform the AM (advanced microscopy) and XRD (X-ray powder diffraction) analyses [8,26,42], which in turn does not cause any change to the molecular structure of the analyzed particles [43][44][45][46][47][48]. The analysis of the collected material was carried out with the X-ray diffractometer NAPLOCK and X-ray Bruker (D8 DISCOVER) to identify the mineral and amorphous phases of the sampled chemical elements [49].…”
Section: Methodsmentioning
confidence: 99%