Nanometer focusing of X-rays with modified reflection zone plates

Michette, A. G.; Pfauntsch, Sławka J.; Erko, A.; Firsov, Alexander A.; Svintsov, A. A.

doi:10.1016/j.optcom.2004.09.073

Cited by 30 publications

(20 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Whilst in some cases, the effects of EMI are no more than a minor irritant (e.g., the screen distortion caused by the use of a wireless emitting device near a TV), in others, they may be potentially lethal (e.g., the use of a cell phone onboard an aircraft). As a result, it is essential that the effects of EMI on common electronic components are thoroughly understood [5][6][7][8][9][10][11][12][13][14][15][16][17][18][19]. Accordingly, the present study considers the EMI response of a bistable multivibrator, a component with wide-ranging applications in the electronics field, including Ref.…”

Section: Introductionmentioning

confidence: 99%

Investigation Into Time- And Frequency-Domain Emi-Induced Noise in Bistable Multivibrator

Tsai¹

2010

PIER

View full text Add to dashboard Cite

Abstract-Electromagnetic interference (EMI) has a negative effect upon the performance of circuit communication systems. The present study considers the case of EMI induced in a conducting wire, and derives equations to establish the effect of the EMI on a bistable multivibrator. The validity of the equations is verified experimentally. The results indicate that the degree of influence of the EMI on the bistable oscillator depends on the interference power, the interference frequency, the induced power, the output resistance of the circuit, and the parasitic capacitance. Moreover, it is shown that the harmonic noise increases with an increasing interference amplitude and frequency. The theoretical results are found to be in good agreement with the experimental data.

show abstract

Section: Introductionmentioning

confidence: 99%

Investigation Into Time- And Frequency-Domain Emi-Induced Noise in Bistable Multivibrator

Tsai¹

2010

PIER

View full text Add to dashboard Cite

show abstract

“…The parabolic compound refractive lenses (CRL) provide micron-to nano-sized X-ray spots [1,2]. Nanometer-sized focused beams have been produced by using a Fresnel zone plate within the soft X-ray spectrum range [3,4]. A spatial resolution better than 30 nm is reached using a zone plate [5,6].…”

Section: Introductionmentioning

confidence: 99%

Mode Propagation in X-Ray Waveguides

Choi¹,

Jung²,

Kwon³

2008

Journal of the Optical Society of Korea

View full text Add to dashboard Cite

Single-mode propagation conditions of X-ray waveguides are investigated by numerical calculations in order to understand the importance of waveguide design parameters, such as core thickness and the optical constants of waveguide materials, on the transmission and coherence properties of the waveguide. The simulation code for mode analyzing is developed based on a numerical solution of the parabolic wave equation. The initial boundary value problem is solved numerically using a finite-difference scheme based on the Crank-Nicolson scheme. The E-field intensities in a core layer are calculated at an X-ray energy of 8.0 keV for air and beryllium(Be) core waveguides with different cladding layers such as Pt, Au, W, Ni and Si to determine the dependence on waveguide materials. The highest E-field intensity radiated at the exit of the waveguide is obtained from the Pt cladded beryllium core with a thickness of 20 nm. However, the intensity from the air core waveguide with Pt cladding reaches 64% of the Be-Pt waveguide. The dependence on the core thickness, which is the major parameter used to generate a single mode in the waveguide, is investigated for the air-Pt, and Be-Pt waveguides at an X-ray energy of 8.0 keV. The mode profiles at the exit are shown for the single mode at a thickness of up to 20 nm for the air-Pt and the Be-Pt waveguides.

show abstract

“…Their boundaries can be calculated by setting the optical retardation to nλ AE λ 4 . The optical element described so far is essentially a reflection zone plate [8][9][10]. It becomes a reflection photon sieve by centering appropriately shaped nanomirrors, e.g., cylinders, on the dark areas such that the number of nanomirrors decreases smoothly from the center to the boundary of the illuminated area (see Fig.…”

mentioning

confidence: 99%

“…On one hand, the reflection geometry is an obvious solution to break the general resolution limit of transmission optics due to volume diffraction effects [14], in the extreme UV and soft x-ray regimes [8][9][10]15] as well as for hard x rays [16][17][18][19]. On the other hand, to prevent radiation damage, a reflection optical element can be simply and effectively cooled.…”

mentioning

confidence: 99%

Focusing light with a reflection photon sieve

et al. 2011

View full text Add to dashboard Cite

An advanced type of diffractive optical element is presented that combines the concept of the photon sieve with an offaxis, off-normal incidence reflection geometry. Compared to transmission optical elements, the signal-to-background ratio is significantly increased by separating the first from other diffraction orders without drastically reducing the size of the smallest diffractive element. The reflection photon sieve produces sharp foci at maximum contrast and offers the advantages of effective heat dissipation and a large working space above the focal plane. Experimental results for a device working at a photon energy of 100 eV are presented and compared to theory. © 2011 Optical Society of America OCIS codes: 230.1950, 340.7480. The parallel progress in nanofabrication and in the generation of highly brilliant synchrotron radiation has significantly advanced many spectroscopy, scattering, and imaging techniques by pushing them to nanometer-scale spatial resolution over a large part of the electromagnetic spectrum [1,2]. In the extreme UV to soft x-ray regimes, where strong absorption rules out the use of refractive lenses [3], transmission Fresnel zone plates [3-6] currently provide the best spatial resolution. Yet these diffractive optical elements commonly suffer from high background signals due to overlapping diffraction orders, strong secondary intensity maxima resulting from finite size effects, and limited working space between apertures and samples. Here we introduce a novel type of diffraction optics-a reflection photon sieve-that overcomes these limitations by using properly placed nanomirrors or nanoabsorbers [7] to obtain nanometer-scale foci of electromagnetic radiation in an off-axis, off-normal incidence reflection geometry. In addition to excellent focusing properties and good sample access, the design of the device allows for effective heat dissipation. The diffractive imaging of a pointlike source by a reflection photon sieve is schematically illustrated in Fig. 1. When monochromatic light illuminates the optical element under an angle of incidence α, the wave is both directly reflected (zero-order diffraction) and focused into different spots under different diffraction angles β (firstand higher-order diffraction). The curved dark areas on the device indicate the wave paths that contribute constructively to the focal spots. In the actual device these areas would be highly reflective, while the surrounding area would be made of a highly absorbing material. In coordinates of r and s, the condition for constructive interference is given bywhere p and q are the object and image distance, m is the diffraction order, and nλ the optical retardation between different diffraction areas (λ, wavelength; n, integer). Their boundaries can be calculated by setting the optical retardation to nλ AE λ 4 . The optical element described so far is essentially a reflection zone plate [8][9][10]. It becomes a reflection photon sieve by centering appropriately shaped nanomirrors, e.g., cylinders, on the dark...

show abstract

Nanometer focusing of X-rays with modified reflection zone plates

Cited by 30 publications

References 8 publications

Investigation Into Time- And Frequency-Domain Emi-Induced Noise in Bistable Multivibrator

Investigation Into Time- And Frequency-Domain Emi-Induced Noise in Bistable Multivibrator

Mode Propagation in X-Ray Waveguides

Focusing light with a reflection photon sieve

Contact Info

Product

Resources

About