Nanoscale magnetostrictive response in a thin film owing to a local magnetic field

Berger, Ruediger; Krause, F.; Dietzel, Andreas; Seo, Jin Won; Fompeyrine, J.; Locquet, Jean‐Pierre

doi:10.1063/1.125835

Cited by 4 publications

(2 citation statements)

References 18 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Other imaging techniques based on the magnetostrictive response have been recently reported, 30 however, their lateral resolution is only about 100 nm.…”

mentioning

confidence: 99%

Magnetic domain and domain-wall imaging of submicron Co dots by probing the magnetostrictive response using atomic force microscopy

Wittborn

Rao

Nogués

et al. 2000

Applied Physics Letters

View full text Add to dashboard Cite

An approach to image the domains and domain walls of small ferromagnetic entities using atomic force microscopy (AFM), with a nonmagnetic AFM probe, has been developed. Exciting the sample in an external ac magnetic field, the distribution of magnetostrictive response at the surface is detected. By this technique, the domains and domain walls of submicron Co dots have been imaged with a 1 nm lateral resolution. In elliptical Co dots with a 350-nm-long axis on a triangular lattice array with 400 nm periodicity, we find evidence for two domains with opposite magnetization orientation across a wall. The domain-wall width in these dots is found to be about 35 nm. Furthermore, we observe a ferromagnetic alignment of the domains in the neighboring dots, which suggests a magnetostatic interaction among the dots.

show abstract

“…Other imaging techniques based on the magnetostrictive response have been recently reported, 30 however, their lateral resolution is only about 100 nm.…”

mentioning

confidence: 99%

Magnetic domain and domain-wall imaging of submicron Co dots by probing the magnetostrictive response using atomic force microscopy

Wittborn

Rao

Nogués

et al. 2000

Applied Physics Letters

View full text Add to dashboard Cite

show abstract

“…The technique uses a vibrating non-magnetic conducting tip to image the magnetic domains of a ferromagnetic sample. The oscillating conducting tip induces currents within the tip which is dependent on the magnetic properties of the sample.Experimental techniques to image magnetostrictive properties of magnetic materials using AFM have also been reported in the literature (Berger et al, 2000;Wittborn et al, 2000;Polushkin et al, 2003).…”

Section: Characterization Of Magnetic Propertiesmentioning

confidence: 99%