2016
DOI: 10.1039/c5ra23135c
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Nanosized surface films on brass alloys by XPS and XAES

Abstract: Chemical state identification and quantification based on photoelectron spectra is challenging in the case of copper and zinc and their alloys.

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Cited by 47 publications
(64 citation statements)
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“…2014 eV and is characteristic of metallic Zn or Zn-containing alloys. 16,27 It is also clear from the XPS data shown in Table 3 that the 4 h reduction treatment of the catalyst in 5% H2/Ar at 500°C did not result in the removal of chloride species from the MImp and CImp catalysts, since a detectable concentration of Clremained. The apparently slighter higher concentration of Cl present after reduction for the CImp catalyst could be due to strong anchoring of Cl to the substrate, resulting in a higher apparent dispersion of Cl after alloying and the associated particle size changes under the reductive atmosphere.…”
Section: Xps Analysismentioning
confidence: 95%
“…2014 eV and is characteristic of metallic Zn or Zn-containing alloys. 16,27 It is also clear from the XPS data shown in Table 3 that the 4 h reduction treatment of the catalyst in 5% H2/Ar at 500°C did not result in the removal of chloride species from the MImp and CImp catalysts, since a detectable concentration of Clremained. The apparently slighter higher concentration of Cl present after reduction for the CImp catalyst could be due to strong anchoring of Cl to the substrate, resulting in a higher apparent dispersion of Cl after alloying and the associated particle size changes under the reductive atmosphere.…”
Section: Xps Analysismentioning
confidence: 95%
“…The inhibitory effect on the kinetics of oxygen reduction and on the cathodic current density was found to be particularly strong on brass [21]. XPS surface analysis on "as received" brass alloys revealed a thick oxide film with composition 84% copper oxide and 16% zinc oxide [22], whereas on mechanically polished alloys only a very thin oxide film (<2 nm) is present (Fig. 8, [22]), confirming the influence of the oxide layer on the cathodic oxygen reduction currents and thus on Rp.…”
Section: Mechanistic Interpretationmentioning
confidence: 96%
“…Considering that the common Cu XPS measurement such as Cu 2p photoemission spectra was not convincible enough to clarify Cu species in different valent state, Cu-LMM Auger spectra recorded according to kinetic energy have been widely employed for distinguishing Cu surface feature. [30][31][32][33] Following the consideration, Cu-LMM spectra of the samples were given in Fig. 2(C).…”
Section: -7mentioning
confidence: 99%