Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)
DOI: 10.1109/elinsl.2002.995943
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New aging diagnostics for microdischarge assessment of high dV/dt stressed mica paper capacitors

H. Gill
1
,
Robert Doney
2
,
E.K. Althoff
3
et al.
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