“New automotive” — Considerations for reliability, robustness and resilience for CMOS interconnects

Robustness, resilience: typology of definitions through a multidisciplinary structured analysis of the literature

“…The other articles in the row and the column 'confusion' finally correspond to authors giving the same definition for the terms of robustness and resilience but it may have made slight differences. Weide-Zaage et al (2018) define the resilience as "the ability to reduce the amount and effect of hazards, unexpected failure mechanisms and their consequences." In their article the description appear similar to the type 2 robustness.…”

“…, Schlichtmann (2016), Weide-Zaage et al (2018), Fryer et al (1987), Zhu and Basar (2015), Lucas et al (2018), Okoh and Haugen (2015), Wybo (2008), Balzari and Balzari (2017), Huizar et al (2018), Corman et al (2018), Faber et al (2017), Dias (2015), Adenso-Díaz et al (2017), Spiegler et al (2012), Ivanov et al (2014), Mens et al (2015), Faber et al (2018), Wang et al (2014), Pien et al (2015), Jenelius and Cats (2015), Calvert and Snelder (2018), Wang et al (2017b), Feng et al (2017), Artsiomchyk and Zhivitskaya (2013), Sun et al (2017), Klibi et al (2010), Ivanov and Sokolov (2013), Huang et al (2017), Wang et al (2017a), Kim et al (2017), Barabadi and Ayele (2018) Abimbola and Topp (2018), Mumby et al (2014), Dragicevic (2016), Krupa et al (2014), Anderies et al (2013), Anderies and Hegmon (2011), Fleischman et al (2010), Domptail et al (2013, Witten (2014), Nair and Howlett (2016), …”