2022
DOI: 10.1007/s10765-022-03129-3
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New Emissivity Measuring System with High Accuracy Under Controlled Environment Conditions

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Cited by 5 publications
(1 citation statement)
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“…In the above equations, n = 1, 2, 3, • • • , T n−1 and T n represent the initial temperature and final temperature of the nth heating period, T 0 = T S = T ∞ = 25 • C. The simulation curves of heating temperature under different resistivity are shown in Figure 4. When the simulation conditions are within certain parameters (input current I = 1.1 A), the length and width of the micro-hotplate are both 5 mm, the thickness of the Si, SiO 2 , and Cu layers are H1 = 300 µm, H2 = 1 µm, and H3 = 25 µm, and the material emissivity is referred to in references [24,25]. The simulation curves of heating temperature under different resistivities of silicon layers are shown in Figure 4.…”
Section: Effect Of Silicon Resistivity On Heatingmentioning
confidence: 99%
“…In the above equations, n = 1, 2, 3, • • • , T n−1 and T n represent the initial temperature and final temperature of the nth heating period, T 0 = T S = T ∞ = 25 • C. The simulation curves of heating temperature under different resistivity are shown in Figure 4. When the simulation conditions are within certain parameters (input current I = 1.1 A), the length and width of the micro-hotplate are both 5 mm, the thickness of the Si, SiO 2 , and Cu layers are H1 = 300 µm, H2 = 1 µm, and H3 = 25 µm, and the material emissivity is referred to in references [24,25]. The simulation curves of heating temperature under different resistivities of silicon layers are shown in Figure 4.…”
Section: Effect Of Silicon Resistivity On Heatingmentioning
confidence: 99%