New qualification approach for optoelectronic components

Long‐term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests

“…In this context, we only used Telcordia specifications to establish stress levels for our ageing tests and then optical power output was monitored versus time for reliability calculations regarding previous failure criteria 16,39 .…”

“…Indeed, the Telcordia requirements propose for each family of components a grid of tests to be performed to demonstrate a standard robustness level, by applying thermal or mechanical stresses with pass or failure criteria. This approach has the main advantage of making an easy comparison between different manufacturers 16 .…”

Electroluminescence spectroscopy for reliability investigations of 1.55 μm bulk semiconductor optical amplifier

“…Nevertheless the use of standard recommendations highlights several drawbacks. New qualification methodologies are now proposed to face the optoelectronic industry modifications and provide end-users with relevant reliability data [2]. Such an evolution of qualification tests requires developing experimental techniques and tools more oriented towards physical mechanisms origin but also physics of failure than usual experimental qualification tests often performed with "go-no go" status at the end of product development.…”

Monte-carlo computations for predicted degradation of photonic devices in space environment

“…Facing actual qualification challenges, a new qualification approach is proposed by focusing on reliability concerns at the early stage of product development [7]. This method has already shown to be of great importance and the results should help to implement component design rules based on physics of failure knowledge.…”