New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405

Marinissen, Erik Jan; Evans, Adrian; Chuang, Po-Yao; Keim, Martin; Chandra, Anshuman

doi:10.1109/ets61313.2024.10567355

2024 IEEE European Test Symposium (ETS) 2024

DOI: 10.1109/ets61313.2024.10567355

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New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405

Erik Jan Marinissen,

Adrian Evans,

Po-Yao Chuang

et al.

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New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405

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