2015 IEEE 33rd VLSI Test Symposium (VTS) 2015
DOI: 10.1109/vts.2015.7116284
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No Fault Found: The root cause

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Cited by 4 publications
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“…For example, when considering Printed Circuit Board Assemblies (PCBAs) test, it is common to see functional test as the last step, mainly targeting dynamic defects. The importance of this kind of defects is significantly increasing in the last years, especially since they are considered one of the major contributors for Non Failure Found (NFF) [37,41], thus raising the interest for any solution able to improve the achievable defect coverage.…”
Section: Introductionmentioning
confidence: 99%
“…For example, when considering Printed Circuit Board Assemblies (PCBAs) test, it is common to see functional test as the last step, mainly targeting dynamic defects. The importance of this kind of defects is significantly increasing in the last years, especially since they are considered one of the major contributors for Non Failure Found (NFF) [37,41], thus raising the interest for any solution able to improve the achievable defect coverage.…”
Section: Introductionmentioning
confidence: 99%