Noise analysis and measurement of time delay and integration charge coupled device

Abstract

Noise analysis and measurement of time delay and integration charge coupled device *Wang De-Jiang( ) a)b) † and Zhang Tao( ) a)a)

Nonlinear effect of the structured light profilometry in the phase-shifting method and error correction

“…But, two major error sources exist in experiment. One is the harmonic spectrums overlapping, [7,17] and the other is the complex spectrum of irregular deformed fringes. Therefore, in experiment, undesired harmonics cannot be completely eliminated and phase error exists.…”

Effect of the nonlinearity of the CCD in Fourier transform profilometry on spectrum overlapping and measurement accuracy

“…[1][2][3][4] When it is used to measure object height, under ideal conditions, there may exist a direct proportional relationship between the light intensity output and that of the input in dynamic scope of the charge coupled device (CCD). [5][6][7] However, under the actual conditions, because of the nonlinearity of CCD, when we use a CCD camera to acquire the deformed fringe of the object surface and then to carry, the Fourier transformation, [8][9][10] may include not only the first-order spectra but also the second-order and third-order spectra and so on among spectrum distribution, leading to the spectrum overlapping phenomenon. Therefore, not only the application scope of the method is restricted, but also the measurement accuracy of the object shape is reduced.…”

An image compression method for space multispectral time delay and integration charge coupled device camera

“…Multispectral time delay and integration charge coupled device (TDICCD) [1][2][3][4] images are of interest for a large number of applications, including geology, environmental monitoring, natural resource management, and meteorology. The growing interest is motivated by several concurring reasons.…”