2016
DOI: 10.1016/j.optlastec.2016.01.026
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Nonlinear interaction of intense hypergeometric Gaussian subfamily laser beams in plasma

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Cited by 21 publications
(12 citation statements)
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“…2009; Sobhani et al. 2016 c , d ), one may define the perfect phase matching condition as . In the presence of this ripple wavenumber, the effect of the relative Gouy phases of the input lasers is removed and perfect phase matching is achieved.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…2009; Sobhani et al. 2016 c , d ), one may define the perfect phase matching condition as . In the presence of this ripple wavenumber, the effect of the relative Gouy phases of the input lasers is removed and perfect phase matching is achieved.…”
Section: Resultsmentioning
confidence: 99%
“…This electron density distribution can be produced by different sources of energy (Kaur, Sharma & Salih 2009; Sobhani et al. 2016 c , d ). The -component of (2.7) can be deduced as where is the permittivity of the plasma medium at the THz frequency .…”
Section: Theoretical Analysismentioning
confidence: 99%
“…For biosensor applications, the use of the proposed CRR sensor may allow the detection of small biomolecules. Furthermore, owing to non-ionizing characteristics and high penetrating power of terahertz (THz) waves, the THz generation is of great interest (Sobhani et al , 2016b; Sobhani et al , 2016a; Sobhani et al , 2016c; Sobhani, 2017a; Sobhani et al , 2016d; Sobhani et al , 2017a; Sobhani et al , 2017b; Sobhani et al , 2017c; Sobhani, 2017b; Sobhani, 2017c; Sobhani et al , 2018a; Sobhani et al , 2018b; Sobhani and Zohrabi, 2018). We are currently investigating the designing of a high-sensitivity sensor in the THz domain which is based on reflection-type MRRs.…”
Section: Discussionmentioning
confidence: 99%
“…, where e m k T 8 , where n 00 and n 0 are the electron density in the absence and presence of the MW electric field, respectively [8,27]. The dielectric permittivity varies as a function of the sum of electric fields of TE 10 and TE 20 modes, which is con-…”
Section: Device Modeling and Analysismentioning
confidence: 99%