2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) 2010
DOI: 10.1109/smic.2010.5422977
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Novel BiST methods for parametric test in wireless transceivers

D. Webster
1
,
Ganesan Thiagarajan
2
,
S. Ramakrishnan
3
et al.
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Cited by 6 publications
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