“…As stated, these properties can be analyzed using different characterization tools such as X-ray diffractometer (XRD), UV-vis spectrophotometer, PL spectrometer, source meter, atomic force microscope (AFM), scanning electron microscope (SEM), and energy dispersive spectroscope (EDS). [183][184][185][186][187][188][189][190][191][192] The influence of different factors on the properties of ZnTe films is discussed in detail herein.…”