Obtaining the Effective Dielectric Permittivity of a Conducting Surface in the Terahertz Range via the Characteristics of Surface Plasmon Polaritons

Abstract

With the intensive development of data transmitting and processing devices of the terahertz (THz) frequency range, an important part of which are integrated plasmonic components and communication lines, it becomes necessary to measure correctly the optical constants of their conductive surfaces. In the paper we describe a reliable method for determining the effective permittivity εm of a metal surface from the measured characteristics (refractive and absorption indices) of THz surface plasmon polaritons (SPPs). The novelty of the method is the conduction of measurements on a metal surface with a dielectric layer of subwavelength thickness, suppressing the radiative losses of SPPs, which are not taken into account by the SPP dispersion equation. The method was tested on a number of flat "gold sputtering - zinc sulfide layer - air" structures with the use of the THz radiation (λ0 = 141 μm) of the Novosibirsk free electron laser (NovoFEL). The SPP characteristics were determined from interferograms measured with a plasmon Michelson interferometer. It was found that the method allowed a significant increase in the accuracy of εm in comparison with measurements on the same metal surface without a dielectric layer.