2024
DOI: 10.1039/d3cp05673b
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On machine learning analysis of atomic force microscopy images for image classification, sample surface recognition

I. Sokolov

Abstract: Atomic force microscopy (AFM or SPM) imaging is one of the best matches with machine learning (ML) analysis among microscopy techniques. The digital format of AFM images allows for direct...

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Cited by 4 publications
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References 48 publications
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