On the Safe Operating Area of InP HBTs

Müller, Markus; Fregonese, Sebastien; Weimer, Christoph; Liang, Guangsheng; Jin, Xiaodi; Froitzheim, Maximilian; Zimmer, Thomas; Schröter, Michael

doi:10.1109/bcicts59662.2024.10745684

2024 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) 2024

DOI: 10.1109/bcicts59662.2024.10745684

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On the Safe Operating Area of InP HBTs

Markus Müller,

Sebastien Fregonese,

Christoph Weimer

et al.

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On the Safe Operating Area of InP HBTs

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