On the Variation in Surface State of Nominally Identical Fused Silica Optics Surfaces

Abstract

A considerable number of different tools and operating materials are used in classical optics manufacturing. Moreover, further parameters such as environmental and process conditions contribute to material removal and surface smoothing in the course of production. A large potential variety of the final surface state of optics can thus be expected. Against this background, nominally identical fused silica optics surfaces purchased from different suppliers were investigated in the present work via x‐ray photoelectron spectroscopy, laser‐induced breakdown spectroscopy, infrared spectroscopy, ellipsometry, and atomic force microscopy. It is shown that the surfaces under consideration feature quite different types and degrees of contamination that can be attributed to the particularly used water and polishing agent. Moreover, slight differences in index of refraction and surface roughness were detected. The presented data thus confirm the expectation that the surface state of an optical component might depend on its origin. The findings are intended to sensitize users regarding such a potential impact, for example, when switching to other suppliers for bought‐in parts and outsourced precision optics items.