Open Circuit Fault Diagnosis Technique for Inverter Switches and Gate Drive Malfunction

Abstract

Open circuit faults (OCFs) in voltage source inverters (VSIs) can significantly affect their performance and reliability. In this paper, a novel fault diagnosis technique (FDT)is presented for the detection and classification of two types of OCFs in VSIs: gate drive malfunction (GDM) and open switch fault (OSF). the effect of these OCFs on the output current of the VSI is analysed, this shows that they can be identified and distinguished using the average and root mean square (RMS) ratio of the current parameters. The proposed FDT is simple to implement and can identify switch faults with quick response, without the need for additional equipment. In this work the authors adopted the ensemble bagged tree classification method to detect and classify the GDM and OSF, the results show the credibility of the proposed technique in identifying different open circuit faults.