Operations on Multiple Transition Faults without Enumeration

Abstract

Abstract.The multiple transition fault model has been used to represent alternative defective gate combinations in the circuit. However, the number of faults is very large even of modest size circuits and therefore the defective configuration may not be considered. It is shown that multiple transition faults can be stored compactly in Binary Decision Diagrams. Furthermore, important operations for identifying the location of failures are implemented without fault enumeration. Experimental results on some of the largest ISCAS'85, ISCAS'89. and ITC'99 benchmarks demonstrate the scalability of the proposed method.