Optical Absorption and Refractive Index of X-ray Irradiated Cu6PSe5I-Based Thin Film

Materials for Optical Sensors of X-ray Irradiation Based on (GaxIn1 – x)2Se3 Films

“…For chalcogenide As 2 S 3 thin film, an increase in the refractive index and a decrease in the film thickness (increase in the density) as a result of the X-ray irradiation are obtained, which confirms that the changes in 𝑛 stem occur primarily due to the changes in the film density as expected from the Clasius-Mossotti equation [18]. It should be noted that the influence of X-ray irradiation was recently studied for argyrodite-based superionic thin films [19,20]. As the irradiation time increases, the decreases in the energy position of the absorption edge, as well as the increase in the Urbach energy and refractive index for an Cu 5.56 P 1.66 S 4.93 I 0.85 thin film were observed [19].…”

“…As the irradiation time increases, the decreases in the energy position of the absorption edge, as well as the increase in the Urbach energy and refractive index for an Cu 5.56 P 1.66 S 4.93 I 0.85 thin film were observed [19]. For Cu 5.5 P 1.2 Se 5.0 I 1.3 thin films, the nonlinear increase in the energy pseudogap and Urbach energy, as well as the nonlinear decrease in the refractive index with an increase in the X-ray irradiation time were revealed [20]. In Ref.…”

“…It should be noted that the influence of Xray irradiation on optical properties of thin films was studied in Refs. [15][16][17][18][19][20][21]. It was shown that, in MgPc thin films, the X-ray irradiation leads to an increase in the energy gap from 2.735 eV to 2.81 eV and in the refractive index [15].…”

Optical studies of X-ray irradiated (Ga0.4In0.6)2Se3 films

“…It worthwhile that the influence of X-ray irradiation on the optical properties of thin films of different types (e.g., those based upon MgPc, CoMTPP, Bi2Te3, a-Se1−xAsx and Cu6PS5I) has earlier been studied in Refs. [13][14][15][16][17][18].…”