Optical and Microstructural Characterization of Thin Layers

Skowroński, Łukasz

doi:10.3390/cryst10090749

Crystals

2020

DOI: 10.3390/cryst10090749

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Optical and Microstructural Characterization of Thin Layers

Łukasz Skowroński¹

Abstract: The microstructure and optical properties of layers strongly depend on the method of synthesis. This Special Issue on “Optical and Microstructural Characterization of Thin Layers” is a collection of papers on the relationships between the growth conditions and specific properties of thin films.

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Optical and Microstructural Characterization of Thin Layers

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References 6 publications

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