Optical bandgap and width of Urbach tail of lithium doped zinc oxide films deposited by SILAR method

Vamadevan, Rakhesh; Kumar, Vaisakh Rajendra; Saji, J.

doi:10.1063/5.0061016

National Conference on Physics and Chemistry of Materials: Ncpcm2020 2021

DOI: 10.1063/5.0061016

|View full text |Cite

Optical bandgap and width of Urbach tail of lithium doped zinc oxide films deposited by SILAR method

Rakhesh Vamadevan¹,

Vaisakh Rajendra Kumar²,

J. Saji³

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2024

Publication Types

Select...

Other1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

References 13 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

Optical parameter determination of amorphous semiconductor thin films for photovoltaic device modeling

Farha,

Pillai,

Nair

et al. 2024

Fourth International Conference on Advances in Physical Sciences and Materials: Icapsm 2023

View full text Add to dashboard Cite

Optical parameter determination of amorphous semiconductor thin films for photovoltaic device modeling

Farha,

Pillai,

Nair

et al. 2024

Fourth International Conference on Advances in Physical Sciences and Materials: Icapsm 2023

View full text Add to dashboard Cite

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Optical bandgap and width of Urbach tail of lithium doped zinc oxide films deposited by SILAR method

Cited by 1 publication

References 13 publications

Optical parameter determination of amorphous semiconductor thin films for photovoltaic device modeling

Optical parameter determination of amorphous semiconductor thin films for photovoltaic device modeling

Contact Info

Product

Resources

About