2010
DOI: 10.1002/pssc.200982414
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Optical characterisation of BiFeO3 epitaxial thin films grown by pulsed‐laser deposition

Abstract: Epitaxial thin films of bismuth ferrite, BiFeO3, were deposited by pulsed laser deposition (PLD) on SrTiO3 (100), Nb‐doped SrTiO3 (100) and DyScO3 (110) substrates. Ellipsometric spectra are obtained in the energy range 0.73‐9.5 eV by combining Variable Angle Spectroscopic Ellipsometry (VASE) and vacuum ultraviolet (VUV) ellipsometry with synchrotron radiation. The optical constants of BiFeO3 films were determined by analysing the ellipsometric spectra with a model that describes the optical response of a syst… Show more

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Cited by 22 publications
(12 citation statements)
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“…The determined E g value of pure BFO is 2.717 ± 0.008 eV, which is in good agreement with that reported in Ref. [24]. And the band gap of other four BEFO x (x = 0.03, 0.05, 0.07, 0.10) films is 2.689 ± 0.009 eV, 2.623 ± 0.007 eV, 2.586 ± 0.008 eV and 2.567 ± 0.007 eV, respectively.…”
Section: Resultssupporting
confidence: 90%
“…The determined E g value of pure BFO is 2.717 ± 0.008 eV, which is in good agreement with that reported in Ref. [24]. And the band gap of other four BEFO x (x = 0.03, 0.05, 0.07, 0.10) films is 2.689 ± 0.009 eV, 2.623 ± 0.007 eV, 2.586 ± 0.008 eV and 2.567 ± 0.007 eV, respectively.…”
Section: Resultssupporting
confidence: 90%
“…4, bottom panel). This is in agreement with previous reports for comparable R-phase samples [16][17][18] and corresponds to a redshift of around 390 meV with respect to BiFeO 3 on LaAlO 3 .…”
Section: B Transitions and Excitationssupporting
confidence: 93%
“…A similar procedure was also used for the characterization of the BiFeO 3 epitaxial thin films. 31,32 The fits are shown in Fig. 1(a) by continuous lines.…”
Section: Resultsmentioning
confidence: 97%