Optical Characterization of Native Defects in 4H–SiC Irradiated by 10 MeV Electrons with Subsequent Annealing

Zhang, Y.; Wang, K.; Wang, H.; Tian, Yuming; Wang, Y.; Li, J.; Chai, Yisheng

doi:10.1007/s10812-021-01104-8

J Appl Spectrosc

2021

DOI: 10.1007/s10812-021-01104-8

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Optical Characterization of Native Defects in 4H–SiC Irradiated by 10 MeV Electrons with Subsequent Annealing

Y. Zhang

K. Wang

H. Wang

et al.

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Optical Characterization of Native Defects in 4H–SiC Irradiated by 10 MeV Electrons with Subsequent Annealing

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