2018
DOI: 10.1039/c8ra01382a
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Optical constants acquisition and phase change properties of Ge2Sb2Te5 thin films based on spectroscopy

Abstract: In this work, phase change chalcogenide Ge 2 Sb 2 Te 5 (GST) thin films were fabricated by magnetron sputtering. The optical properties, especially the optical constants (refractive index and extinction coefficient), of such alloys were systematically studied by investigating their thermally and photo-

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Cited by 55 publications
(20 citation statements)
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“…In our case, the spectra recorded for this type of material are described by two peaks: 110 and 163 cm −1 . In accordance with the data published in References [6,36,37], the first peak was attributed to the active Raman E g mode, while the second one to the A 1g vibrational mode. However, for the Sb 2 Te 3 film deposited using the 266 nm radiation of the Nd-YAG laser, additional vibrational modes were detected which were associated with the antimony-rich phase observed through XRD measurements.…”
Section: Resultssupporting
confidence: 91%
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“…In our case, the spectra recorded for this type of material are described by two peaks: 110 and 163 cm −1 . In accordance with the data published in References [6,36,37], the first peak was attributed to the active Raman E g mode, while the second one to the A 1g vibrational mode. However, for the Sb 2 Te 3 film deposited using the 266 nm radiation of the Nd-YAG laser, additional vibrational modes were detected which were associated with the antimony-rich phase observed through XRD measurements.…”
Section: Resultssupporting
confidence: 91%
“…The good agreement of their observations to the experimental vibrational spectra allowed them to assign each peak to specific phonons: E g at 46 and 113 cm −1 and A 1g at 62 and 166 cm −1 . A sketch of the displacement patterns of phonons is also presented in Reference [37]. Two peaks at 110 and 165 cm −1 were also observed by Nemec et al [6] in the Raman spectroscopy study on Sb 2 Te 3 bulk materials used as targets in the deposition process.…”
Section: Resultsmentioning
confidence: 59%
“…At the outset, it may be reasonable to assume that the annealing temperature governs film structures leading to different conductivities. However, X‐ray patterns of the present films, exemplified in Figure , substantiated that the crystallite size evaluated by applying Scherrer's equation to the 200 peak (at 2 θ ≈ 30°) was ≈15 nm, irrespective of the annealing temperatures of 200 and 250 °C (with a heating rate of 5−10 °C min −1 and a holding duration of 10 min in Ar atmosphere), the behavior being similar to that reported in previous studies . Nevertheless, since the amorphous structure provides broad low‐intensity halos, it is plausible that noncrystalline regions and/or grain boundaries still remain, which affect the scattered conductivities.…”
Section: Electrical Conductivitysupporting
confidence: 89%
“…The cubic and hexagonal phases are obtained by annealing at 185 and 300 °C, respectively, for 10 min in Ar gas atmosphere. The peak indices follow previous studies …”
Section: Electrical Conductivitysupporting
confidence: 86%
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