Proceedings of the Conference on Design, Automation and Test in Europe 2008
DOI: 10.1145/1403375.1403611
|View full text |Cite
|
Sign up to set email alerts
|

Optimal MTCMOS reactivation under power supply noise and performance constraints

Andrea Calimera
1
,
Luca Benini
2
,
Enrico Macii
3

Abstract: ABSTRACT

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2008
2008
2021
2021

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 8 publications
references
References 11 publications
0
0
0
Order By: Relevance

Optimum sizing of the sleep transistor in MTCMOS technology

Sharroush
1
,
Abdalla
2
2021
AEU - International Journal of Electronics and Communications
2
0
1
0
View full textAdd to dashboardCite

Optimum sizing of the sleep transistor in MTCMOS technology

Sharroush
1
,
Abdalla
2
2021
AEU - International Journal of Electronics and Communications
2
0
1
0
View full textAdd to dashboardCite

Integrating Clock Gating and Power Gating for Combined Dynamic and Leakage Power Optimization in Digital CMOS Circuits

Macii
1
,
Bolzani
2
,
Calimera
3
et al. 2008
2008 11th EUROMICRO Conference on Digital System Design Architectures, Methods and Tools
22
0
4
0
View full textAdd to dashboardCite

Analysis of NBTI-induced SNM degradation in power-gated SRAM cells

Calimera
1
,
Macii
2
,
Poncino
3
2010
Proceedings of 2010 IEEE International Symposium on Circuits and Systems
20
0
17
0
View full textAdd to dashboardCite
scite logo

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Product
Browser ExtensionAssistant by sciteCitation Statement SearchReference CheckVisualizationsDashboardsExplore JournalsExplore OrganizationsExplore FundersEmbedding BadgeEmbedding Citation SearchPricing
Resources
BlogHelp & FAQAccessibility StatementAPI TermsFor Universities & GovernmentsFor ResearchersFor PublishersFor Corporate, Pharma & EnterpriseAuthor MarketingBecome an AffiliateGet an organization trial or quotescite Data & Services
About
News & PressCareersRead our PaperCoverage

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

BlogTerms and ConditionsAPI TermsPrivacy PolicyContactCookie PreferencesDo Not Sell or Share My Personal Information

Copyright © 2024 scite LLC. All rights reserved.

Made with 💙 for researchers

Part of the Research Solutions Family.