Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series

Abstract

Abstract

Applications of Transmission Electron Microscopy in Phase Engineering of Nanomaterials

“…These deviations displace the probe positions of the entire scan row and manifest as flagging and skipping artifacts. 168,169 Scan distortion can be removed by nonlinear unwarping. 165,168−171 Image drift refers to the distortion caused by the movement of specimens during scanning, resulting in shear, expansion, or contraction of the recorded images.…”

“…Scan distortion, with a frequency lower than scan noise (Figure a), is caused by random offset deviations at the beginning of each row in the row-wise scan. These deviations displace the probe positions of the entire scan row and manifest as flagging and skipping artifacts. , Scan distortion can be removed by nonlinear unwarping. ,− …”

“…Distortions caused by image drift have lower frequencies compared with scan distortion or scan noise, and their severity depends on the scanning rate . Affine transformation can be used to remedy distortions caused by image drift. ,,− …”

“…An effective way to reduce image shear is to scan quickly and average multiple fast-scanned frames using image registration methods. If distortion persists in the fast-scanned frames, advanced algorithms ,− could be used to correct it. Sang et al developed a method to determine the rate and direction of specimen drift by analyzing the distortions of a series of images collected with varying scan directions.…”