“…During the degradation process, trap states and defects are created due to different paths of degradation, e.g., photooxidation, diffusion of atoms, reorganization of BHJ, and many others. [32][33][34][35][36][37] Some of these trap states, close to the ITO/ZnO, could be filled up during the light-soaking illumination. 19,22 On the other hand, the trap states, close to the ZnO/P3HT:PCBM, could change the induced interfacial dipoles.…”