Test and Design-for-Testability in Mixed-Signal Integrated Circuits 2004
DOI: 10.1007/978-0-387-23521-9_9
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Oscillation-Based Test Strategies

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Cited by 4 publications
(8 citation statements)
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“…As previously mentioned, to estimate the concentration of cells at each moment of the experiment, several points must be known: The equations of entire system; that is, the equations of the BioZ electric model and the oscillator. From these equations and using the Describing Function method [ 20 ], two equations are obtained whose solutions allow us to derive the oscillation amplitude and frequency. The BioZ equations: where is the transfer function of the cell-electrode electrical model and the other parameters are defined by the resistances and the capacitors of the electric model ( , , , , and ), as can be seen on Equations (7)–(11).…”
Section: Methodsmentioning
confidence: 99%
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“…As previously mentioned, to estimate the concentration of cells at each moment of the experiment, several points must be known: The equations of entire system; that is, the equations of the BioZ electric model and the oscillator. From these equations and using the Describing Function method [ 20 ], two equations are obtained whose solutions allow us to derive the oscillation amplitude and frequency. The BioZ equations: where is the transfer function of the cell-electrode electrical model and the other parameters are defined by the resistances and the capacitors of the electric model ( , , , , and ), as can be seen on Equations (7)–(11).…”
Section: Methodsmentioning
confidence: 99%
“…The equations of entire system; that is, the equations of the BioZ electric model and the oscillator. From these equations and using the Describing Function method [ 20 ], two equations are obtained whose solutions allow us to derive the oscillation amplitude and frequency.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…To overcome these problems, several authors have proposed different Built-In-Self-Test (BIST) techniques where signals are internally generated and/or analysed [2][3][4][5][6][7][8]. Another possible and less expensive solution consists in using DFT techniques to internally transform the analogue signals into digital signals that are made controllable and observable from the chip I/Os [4,9,10,11,12]. So, only digital signals are externally handled by a non-expensive "digital" test equipment.…”
Section: Introductionmentioning
confidence: 99%
“…1) using the oscillation-test strategy [1,5,6,7]. The test configuration and the feedback network were reported in [2].…”
Section: Bics Operationmentioning
confidence: 99%